Scanning Tunnelling Microscopy

This volume is devoted to the rapidly growing field of scanning tunneling microscopy and spectroscopy (STM). Originally developed by G. Binnig, H. Tohrer and their coworkers at the IBM Research Institute Ruschilikon, Switzerland, for applications in surface physics, the method is becoming interesting for other disciplines as well, eg. materials sciences, biology, chemistry, and chemical physics, electrical engineering, etc. The papers collected in this volume cover the theory of STM, instrumental problems and important applications in the physics of clean and metal-covered semiconductors, clean metal, allow and other compound surfaces, adsorption on metals, electrochemical processes and biological applications.