Stress-Induced Phenomena in Metallization
作者:
Paul S·Ho
|
Shinichi Ogawa
|
Ehrenfried Zschech
出版年: 2009-6
页数: 242
定价: $ 136.73
ISBN: 9780735406803
出版年: 2009-6
页数: 242
定价: $ 136.73
ISBN: 9780735406803
内容简介
Stress-induced voiding and electromigration have emerged to become key reliability problems for submicron interconnect metallization. This has led to the First International Stress Workshop on Stre...
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