Stress-Induced Phenomena in Metallization
作者:
Ehrenfried Zschech
|
Karen Maex
|
Paul S·Ho
出版年: 2006-2
页数: 383
定价: $ 167.24
ISBN: 9780735403109
出版年: 2006-2
页数: 383
定价: $ 167.24
ISBN: 9780735403109
内容简介
These proceedings present current research on issues related to stress-induced phenomena in on-chip metal interconnects and solder joints. This volume will appeal to scientists, engineers, graduate students interested in research and development of microelectronic devices as well as technology integration, and semiconductor industry professionals and equipment suppliers.
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